Introduction to signal processing
Introduction to signal processing
Analyze jitter to improve high-speed design
IEEE Spectrum
Jitter Testing for Gigabit Serial Communication Transceivers
IEEE Design & Test
Proceedings of the IEEE International Test Conference 2001
Measuring jitter of high speed data channels using undersampling techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A method of serial data jitter analysis using one-shot time interval measurements
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Extraction of Peak-to-Peak and RMS Sinusoidal Jitter Using an Analytic Signal Method
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
An Embedded Core for Sub-Picosecond Timing Measurements
ITC '02 Proceedings of the 2002 IEEE International Test Conference
ITC '02 Proceedings of the 2002 IEEE International Test Conference
On the Accuracy of Jitter Separation from Bit Error Rate Function
ITC '02 Proceedings of the 2002 IEEE International Test Conference
Timing Jitter Measurement of 10 Gbps Bit Clock Signals Using Frequency Division
VTS '02 Proceedings of the 20th IEEE VLSI Test Symposium
A New Method for Jitter Decomposition Through Its Distribution Tail Fitting
ITC '99 Proceedings of the 1999 IEEE International Test Conference
A Scalable On-Chip Jitter Extraction Technique
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
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In this paper, we propose a method for extracting the spectral information of a multi-gigahertz jittery signal. This method may utilize existing on-chip single-shot period measurement techniques to measure the multi-gigahertz signal periods for spectral analysis. This method does not require an external sampling clock, nor any additional measurement beyond existing techniques. Experimental results show that this analysis method can accurately estimate the amount and frequencies of periodic and random jitter of a multi-gigahertz signal.