IEEE Std 802.3b, C, D, and E - 1989: Supplements to Carrier Sense Multiple Access with Collision Detection (Csma-CD) Access Method and Physical Layer Specifications
Measuring jitter of high speed data channels using undersampling techniques
ITC '98 Proceedings of the 1998 IEEE International Test Conference
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Random Jitter Extraction Technique in a Multi-Gigahertz Signal
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Scalable On-Chip Jitter Extraction Technique
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Jitter spectral extraction for multi-gigahertz signal
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects
IEEE Design & Test
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Qualifying Serial Interface Jitter Rapidly and Cost-effectively
Journal of Electronic Testing: Theory and Applications
A DLL design for testing I/O setup and hold times
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Design specification for BER analysis methods using built-in jitter measurements
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
| Hi-index | 0.00 |
Proper testing of transceivers requires the ability not only to measure generated jitter but also to inject in-band as well as out-of-band jitter for an appropriate receiver tolerance test.