Digital Signal Processing: A Practical Approach
Digital Signal Processing: A Practical Approach
Jitter Measurements of a PowerPC" Microprocessor Using an Analytic Signal Method
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A High-Resolution Jitter Measurement Technique Using ADC Sampling
ITC '01 Proceedings of the 2001 IEEE International Test Conference
An Approach to Consistent Jitter Modeling for Various Jitter Aspects and Measurement Methods
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A New Method for Jitter Decomposition Through Its Distribution Tail Fitting
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Accuracy Requirements in At-Speed Functional Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Random Jitter Extraction Technique in a Multi-Gigahertz Signal
Proceedings of the conference on Design, automation and test in Europe - Volume 1
A Scalable On-Chip Jitter Extraction Technique
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Jitter spectral extraction for multi-gigahertz signal
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
"Signal integrity analysis in the open architecture"
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
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A method for measuring inter-symbol interference, dutycycle distortion, random jitter and periodic jitter isdescribed.The Blackman-Tukey method of signal analysis is used.This allows the application of jitter tolerance masks toensure compliance to data communication standards.Note: Mathematical analysis and computer simulationshave been performed. The autocorrelation function and anFFT for clock jitter analysis have been implemented on ourcurrent product. A provisional patent application has beenfiled.