Risks of rapid application development

  • Authors:

  • Ritu Agarwal;Jayesh Prasad;Mohan Tanniru;John Lynch

  • Affiliations:

  • Robert H. Smith School of Business, University of Maryland, College Park, MD;Department of MIS and Decision Sciences, University of Dayton, Dayton, OH;Applied Technology in Business Program at Oakland University, Rochester, MI;Vertechs Software Solutions, Atlanta, GA

  • Venue:
  • Communications of the ACM
  • Year:
  • 2000

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Abstract