Efficient fault-tolerant certificate revocation

  • Authors:
  • Rebecca N. Wright;Patrick D. Lincoln;Jonathan K. Millen

  • Affiliations:
  • AT&T Labs - Research, 180 Park Avenue, Florham Park, NJ;SRI International, 333 Ravenswood Ave, Menlo Park, CA;SRI International, 333 Ravenswood Ave, Menlo Park, CA

  • Venue:
  • Proceedings of the 7th ACM conference on Computer and communications security
  • Year:
  • 2000

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Abstract