Shape Recovery from Equal Thickness Contours

  • Authors:
  • Ge Cong;Bahram Parvin

  • Affiliations:
  • Lawrence Berkeley National Laboratory, Berkeley, CA;Lawrence Berkeley National Laboratory, Berkeley, CA

  • Venue:
  • IEEE Transactions on Pattern Analysis and Machine Intelligence
  • Year:
  • 2000

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Abstract

A unique imaging modality based on Equal Thickness Contours (ETC) has introduced a new opportunity for 3D shape reconstruction from multiple views. These ETCs can be generated through an interference between transmitted and diffracted beams. We present a computational framework for representing each view of an object in terms of its object thickness and then integrating these representations into a 3D surface by algebraic reconstruction. In this framework, the object thickness is first derived from ideal contours and then extended to real data. For real data, the object thickness is inferred by grouping curve segments that correspond to points of second derivative maxima. At each step of the process, we use some form of regularization to ensure closeness to the original features as well as neighborhood continuity. We apply our approach to images of a submicron crystal structure obtained through a holographic process.