Picture Processing by Computer
ACM Computing Surveys (CSUR)
The reconstruction of binary patterns from their projections
Communications of the ACM
Images from computers and microfilm plotters
Communications of the ACM
Shape Recovery from Equal Thickness Contours
IEEE Transactions on Pattern Analysis and Machine Intelligence
Progress in Picture Processing: 1969--71
ACM Computing Surveys (CSUR)
A collaborative framework for distributed microscopy
SC '98 Proceedings of the 1998 ACM/IEEE conference on Supercomputing
Shape from Equal Thickness Contours
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Tomographic reconstruction using heuristic Monte Carlo methods
Journal of Heuristics
Some Properties of Image-Processing Operations on Projection Sets Obtained from Digital Pictures
IEEE Transactions on Computers
Characterization of Binary Patterns and Their Projections
IEEE Transactions on Computers
Two direct methods for reconstructing pictures from their projections: a comparative study
AFIPS '72 (Spring) Proceedings of the May 16-18, 1972, spring joint computer conference
The number of line-convex directed polyominoes having the same orthogonal projections
DGCI'06 Proceedings of the 13th international conference on Discrete Geometry for Computer Imagery
Computerized tomography with digital lines and linear programming
DGCI'05 Proceedings of the 12th international conference on Discrete Geometry for Computer Imagery
Progressive stochastic reconstruction technique for cryo electron tomography
SIGGRAPH Asia 2013 Posters
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There are situations in the natural sciences and medicine (e.g. in electron microscopy and X-ray photography) in which it is desirable to estimate the gray levels of a digital picture at the individual points from the sums of the gray levels along straight lines (projections) at a few angles. Usually, in such situations, the picture is far from determined and the problem is to find the “most representative” picture. Three algorithms are described (all using Monte Carlo methods) which were designed to solve this problem. The algorithms are applicable in a large and varied number of fields. The most important uses may be the reconstruction of possibly asymmetric particles from electron micrographs and three-dimensional X-ray analysis.