A technology independent approach to hierarchical IC layout extraction
DAC '86 Proceedings of the 23rd ACM/IEEE Design Automation Conference
Direct spatial search on pictorial databases using packed R-trees
SIGMOD '85 Proceedings of the 1985 ACM SIGMOD international conference on Management of data
An integrated debugging system based on E-beam test
Microelectronic Engineering
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ITC '98 Proceedings of the 1998 IEEE International Test Conference
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This paper focuses on the data structures and algorithms used in an integrated electron-beam probing system for IC diagnosis. The goal is to create an effective debugging environment through access to various types of design information. Dedicated databases permit separate schematics and layouts to be cross referenced on line. Special algorithms deliver fast, interactive performance by capitalizing on design hierarchies.