Analog-testability analysis by determinant-decision-diagrams based symbolic analysis

• Authors:

• Tao Pi;C.-J. Richard Shi

• Affiliations:

• Department of Electrical Engineering, University of Washington, Seattle, WA;Department of Electrical Engineering, University of Washington, Seattle, WA

• Venue:
• ASP-DAC '00 Proceedings of the 2000 Asia and South Pacific Design Automation Conference
• Year:
• 2000