Analysis of clocked timing elements for dynamic voltage scaling effects over process parameter variation

Authors:
Hoang Q. Dao;Kevin Nowka;Vojin Oklobdzija
Affiliations:
ACSEL Lab, University of California, Davis, 1 Shields Avenue, Davis, CA;IBM Austin Research Lab, 11400 Burnet Road, MS9460, Austin, TX;ACSEL Lab, University of California, Davis 1 Shields Avenue, Davis, CA
Venue:
ISLPED '01 Proceedings of the 2001 international symposium on Low power electronics and design
Year:
2001

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Abstract