Modeling software failures and reliability growth during system testing

  • Authors:
  • W. K. Ehrlich;T. J. Emerson

  • Affiliations:
  • AT&T Bell Laboratories, 8 Corporate Place, Piscataway, NJ;AT&T Bell Laboratories, 184 Liberty Corner Road, P. O. Box 4908, Warren, NJ

  • Venue:
  • ICSE '87 Proceedings of the 9th international conference on Software Engineering
  • Year:
  • 1987

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Abstract

A number of time-domain software reliability models attempt to predict the growth of a system's reliability during the system test phase of the development life cycle. In this paper we examine the results of applying several types of Poisson-process models to the development of a large system for which system test was performed in two parallel tracks, using different strategies for test data selection. We show that the reliability growth predicted by non-homogeneous Poisson process models was found for only one of these testing strategies. These results imply that the applicability of a reliability growth model to a given software development project will depend on the nature of that project's system test process; they also raise theoretical questions about the assumption of certain statistical properties for failure occurrence during testing.