Application of software reliability modelling to product quality and test process

  • Authors:
  • W. K. Ehrlich;J. P. Stampfel;J. R. Wu

  • Affiliations:
  • AT&T Bell Laboratories, Holmdel, NJ;AT&T Bell Laboratories, Holmdel, NJ;AT&T Bell Laboratories, Holmdel, NJ

  • Venue:
  • ICSE '90 Proceedings of the 12th international conference on Software engineering
  • Year:
  • 1990

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Abstract