Error-Correction Coding for Digital Communications
Error-Correction Coding for Digital Communications
Recursive Pseudoexhaustive Test Pattern Generation
IEEE Transactions on Computers
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A method of pseudoexhaustive test pattern generation is proposed that is suitable above all for circuits using random access scan. Two linear feedback shift registers are used to generate scan addresses and test patterns to be scanned into these addresses. It is shown that the method gives better results than random testing.