Pattern recognition by an optical thin-film multilayer model

  • Authors:
  • Xiaodong Li;Martin Purvis

  • Affiliations:
  • Gippsland School of Computing and Information Technology, Monash University, Churchill, Victoria, Australia E-mail: xiaodong.li@infotech.monash.edu.au;Computer and Information Science, University of Otago, Dunedin, New Zealand E-mail: mpurvis@commerce.otago.ac.nz

  • Venue:
  • Annals of Mathematics and Artificial Intelligence
  • Year:
  • 1999

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Abstract

This paper describes a computational learning model inspired by the technology of optical thin‐film multilayers from the field of optics. With the thicknesses of thin‐film layers serving as adjustable “weights” for the computation, the optical thin‐film multilayer (OTFM) model is capable of approximating virtually any kind of nonlinear mapping. This paper describes the architecture of the model and how it can be used as a computational learning model. Some sample simulation calculations that are typical of connectionist models, including a pattern recognition of alphabetic characters, iris plant classification, and time series modelling of a gas furnace process, are given to demonstrate the model’s learning capability.