Combining Case-Based and Model-Based Reasoning for the Diagnosis of Complex Devices

Authors:
M. P. Féret;J. I. Glasgow
Affiliations:
Department of Computing & Information Science, Queen‘s University, Kingston, Ontario, Canada, K7L 3N6 E-mail: janice@qucis.queensu.ca;Department of Computing & Information Science, Queen‘s University, Kingston, Ontario, Canada, K7L 3N6 E-mail: janice@qucis.queensu.ca
Venue:
Applied Intelligence
Year:
1997

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Abstract

A novel approach to integrating case-based reasoning with model-based diagnosis is presented. This approach, called ExperienceAided Diagnosis (EAD), uses the model of the device and the resultsof diagnostic tests to index and match cases representingpast diagnostic situations. Retrieved cases are then used to overcomeerrors created by the application of incorrect device models.The diagnostic methodology is described and applied to two real-worlddevices. Experimental results demonstrate the effectiveness of both the indexing schema and the matching algorithm. The paper discusseshow these results can be generalized to multiple faultsituations, to other types of device models, and to otherapplications in the field of an artificial intelligence.