Maximizing pin alignment in semi-custom chip circuit layout

  • Authors:

  • P. Widmayer;L. S. Woo;C. K. Wong

  • Affiliations:

  • IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY;IBM Thomas J. Watson Research Center, Yorktown Heights, NY

  • Venue:
  • Integration, the VLSI Journal
  • Year:
  • 1988

Quantified Score

Hi-index 0.00

Visualization

Abstract