Fault tolerant and fault testable hardware design
Fault tolerant and fault testable hardware design
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Computer-Aided Analysis of Electronic Circuits: Algorithms and Computational Techniques
Parametric fault diagnosis for analog systems using functional mapping
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Hi-index | 0.00 |
Analog fault diagnostic methods are reviewed. A branch fault-diagnosis technique that requires a single excitation source at one test frequency is introduced. The technique lets users construct linearly independent branch-diagnosis equations by modulating selected network elements. An example of the technique applied to a two-stage amplifier is given.