A Reliability Testing Environment for Off-the-Shelf Memory Subsystems

  • Authors:

  • Seung H. Hwang;Gwan S. Choi

  • Affiliations:

  • -;-

  • Venue:
  • IEEE Design & Test
  • Year:
  • 2000

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Abstract

A cyclotron-based radiation test environment enables engineers to characterize the soft-error sensitivity of memory subsystems and assess its impact at the system level. Device/circuit modeling and simulation assist the radiation experiments in detecting device-level single-event upsets