Shape Discrimination Using Fourier Descriptors
IEEE Transactions on Pattern Analysis and Machine Intelligence - Special memorial issue for Professor King-Sun Fu
Finding axes of skewed symmetry
Computer Vision, Graphics, and Image Processing
New forms of shape invariants from elliptic Fourier descriptors
Pattern Recognition
Automatic rotational symmetry determination for shape analysis
Pattern Recognition
Line-Drawing Interpretation: Bilateral Symmetry
IEEE Transactions on Pattern Analysis and Machine Intelligence
On the Detection of the Axes of Symmetry of Symmetric and Almost Symmetric Planar Images
IEEE Transactions on Pattern Analysis and Machine Intelligence
Application of Affine-Invariant Fourier Descriptors to Recognition of 3-D Objects
IEEE Transactions on Pattern Analysis and Machine Intelligence
Identification of Faces in a 2D Line Drawing Projection of a Wireframe Object
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Technique for Finding the Symmetry Axes of Implicit Polynomial Curves under Perspective Projection
IEEE Transactions on Pattern Analysis and Machine Intelligence
Skewed mirror symmetry detection from a 2D sketch of a 3D model
GRAPHITE '05 Proceedings of the 3rd international conference on Computer graphics and interactive techniques in Australasia and South East Asia
Genetic Fourier descriptor for the detection of rotational symmetry
Image and Vision Computing
Optimization-based reconstruction of a 3D object from a single freehand line drawing
ACM SIGGRAPH 2007 courses
Skewed rotational symmetry detection from a 2D line drawing of a 3D polyhedral object
Computer-Aided Design
Recursive computation of moments of 2D objects represented by elliptic Fourier descriptors
Pattern Recognition Letters
Modeling and Estimation of the Dynamics of Planar Algebraic Curves via Riccati Equations
Journal of Mathematical Imaging and Vision
Genetic fourier descriptor for the detection of rotational symmetry
WILF'03 Proceedings of the 5th international conference on Fuzzy Logic and Applications
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In this paper, the method of elliptic Fourier descriptors using arc length parameterization is applied to tackle the problem of detection and recovery of symmetry under parallel projection. A simple and fast iteration algorithm together with the invariants of symmetry provides sufficient information for the detection and recovery of symmetry under parallel projection. The proposed method has been extensively tested using symmetric figures under different parallel projections. Simulation results of the algorithm are presented. The extension of this method for planar object recognition under parallel projection is also addressed.