IEEE Transactions on Pattern Analysis and Machine Intelligence
New method for vanishing point detection
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What can we learn about the scene structure from three orthogonal vanishing points in images
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Simultaneous estimation of vanishing points and their converging lines using the EM algorithm
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This paper presents a new method for the detection of vanishing points based on sub-pixel line descriptions which recognizes the existence of errors in feature detection and which does not rely on supervision or the arbitrary specification of thresholds. Image processing and image analysis are integrated into a coherent scheme which extracts straight line structure from images, develops a measure of line quality for each line, estimates the number of vanishing points and their approximate orientations, and then computes optimal vanishing point estimates through combined clustering and numerical optimization. Both qualitative and quantitative evaluation of the algorithms performance is included in the presentation.