Wavelet-based corner detection technique using optimal scale

Authors:
Azhar Quddus;Moncef Gabbouj
Affiliations:
Signal Processing Laboratory, Tampere University of Technology ( TUT), P.O. Box 553, FIN-33101, Tampere, Finland;Signal Processing Laboratory, Tampere University of Technology ( TUT), P.O. Box 553, FIN-33101, Tampere, Finland
Venue:
Pattern Recognition Letters
Year:
2002

Citing 4
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Abstract

In this paper we present a novel technique for wavelet-based corner detection using singular value decomposition (SVD). Here SVD facilitates the selection of global natural scale in discrete wavelet transform. We define natural scale as the level associated with most prominent (dominant) eigenvalue. Eigenvector corresponding to dominant eigenvalue is considered as the optimal scale. The corners are detected at the locations corresponding to modulus maxima. Results indicate the suitability of the approach. Comparison with a recently proposed technique is also provided.