Simulation-based techniques for dynamic test sequence compaction
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Efficient Techniques for Dynamic Test Sequence Compaction
IEEE Transactions on Computers
Putting the Squeeze on Test Sequences
ITC '97 Proceedings of the 1997 IEEE International Test Conference
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Test pattern storage is an important problem affecting all Design for Testability (DfT) techniques based on scan-path. Test compaction is the key idea to reduce this problem, but in case of partial-scan test compaction would concern the concatenation and overlapping of test sequences instead of test vectors. Unfortunately, standard sequential TPGs do not show sufficient capabilities in test sequences compaction. Thus, the paper presents an innovative compaction strategy for test sequences based on implicit techniques. Preliminary results show that the use of the presented technique can sensibly reduce the amount of test patterns which must be stored and applied.