Testability Analysis for Test Generation in Synchronous Sequential Circuits

• Authors:

• R. Wolber;Uwe Gläser;Heinrich Theodor Vierhaus

• Affiliations:

• -;-;-

• Venue:
• ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
• Year:
• 1994