Symbolic fault simulation for sequential circuits and the multiple observation time test strategy

Authors:
R. Krieger;B. Becker;M. Keim
Affiliations:
Computer Science Department, J.W. Goethe-University, Frankfurt am Main, Germany;Computer Science Department, J.W. Goethe-University, Frankfurt am Main, Germany;Computer Science Department, J.W. Goethe-University, Frankfurt am Main, Germany
Venue:
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Year:
1995

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