Symbolic fault simulation for sequential circuits and the multiple observation time test strategy
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
FME '01 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods for Increasing Software Productivity
Computation of minimal counterexamples by using black box techniques and symbolic methods
Proceedings of the 2007 IEEE/ACM international conference on Computer-aided design
Hi-index | 0.00 |