Symbolic fault simulation for sequential circuits and the multiple observation time test strategy
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Fault simulation under the multiple observation time approach using backward implications
DAC '97 Proceedings of the 34th annual Design Automation Conference
Hybrid Fault Simulation for Synchronous Sequential Circuits
Journal of Electronic Testing: Theory and Applications
8.2 On Synchronizing Sequences and Test Sequence Partitioning
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
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