The Multiple Observation Time Test Strategy
IEEE Transactions on Computers - Special issue on fault-tolerant computing
On Fault Simulation for Synchronous Sequential Circuits
IEEE Transactions on Computers - Special issue on fault-tolerant computing
A Hybrid Fault Simulator for Synchronous Sequential Circuits
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Low-Complexity Fault Simulation under the Multiplie Observation Time Testing Approach
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
On Potential Fault Detection in Sequential Circuits
Proceedings of the IEEE International Test Conference on Test and Design Validity
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Hybrid Fault Simulation for Synchronous Sequential Circuits
Journal of Electronic Testing: Theory and Applications
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We present an improved procedure for fault simulation under themultiple observation time approach based on state expansion.Under state expansion, an incompletely specified state reachedduring fault simulation is replaced by 2{k} states, each one assigninga different combination to k unspecified present state variables.For each expanded state, additional output values are thenimplied. As a result, a fault that cannot be identified as detectedusing conventional simulation may now be identified as detected.The procedure proposed here enhances state expansion by backwardimplications to take advantage of every present state variablevalue specified under state expansion. As a result of usingbackward implications, fewer states need to be considered afterstate expansion, fewer state expansions are potentially neededfor every fault, and the number of faults that can be efficientlyconsidered is increased. Experimental results are presented tosupport these claims.