The Throughput of Sequential Testing

  • Authors:
  • Murali S. Kodialam

  • Affiliations:
  • -

  • Venue:
  • Proceedings of the 8th International IPCO Conference on Integer Programming and Combinatorial Optimization
  • Year:
  • 2001

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Abstract

This paper addresses the problem of determining the maximum achievable throughput in a sequential testing system. The input to the system are n bit binary strings. There are n tests in the system, and if a string is subjected to test j then the test determines if bit j in that string is zero or one. The objective of the test system is to check if the sum of the bits in each incoming string is zero or not. The mean time taken to perform each test and the probability that bit j is one are known. The objective of this paper is to determine the maximum input rate that can be processed by this system. The problem of determining the maximum throughput is first formulated as a a quadratic programming problem over a polymatroid with some additional structure. The special structure of the polymatroid polyhedron is exploited to derive an O(n2) algorithm to solve the maximum throughput problem.