Linfinity Voronoi Diagrams and Applications to VLSI Layout and Manufacturing

  • Authors:
  • Evanthia Papadopoulou

  • Affiliations:
  • -

  • Venue:
  • ISAAC '98 Proceedings of the 9th International Symposium on Algorithms and Computation
  • Year:
  • 1998

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Abstract

In this paper we address the L∞ Voronoi diagram of polygonal objects and present applications in VLSI layout and manufacturing. We show that in L∞ the Voronoi diagram of segments consists only of straight line segments and is thus much simpler to compute than its Euclidean counterpart. Moreover, it has a natural interpretation. In applications where Euclidean precision is not particularly important the L∞ Voronoi diagram can provide a better alternative. Using the L∞ Voronoi diagram of polygons we address the problem of calculating the critical area for shorts in a VLSI layout. The critical area computation is the main computational problem in VLSI yield prediction.