Reproducing Synchronization Bugs with Model Checking

  • Authors:
  • Karen Yorav;Sagi Katz;Ron Kiper

  • Affiliations:
  • -;-;-

  • Venue:
  • CHARME '01 Proceedings of the 11th IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods
  • Year:
  • 2001

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Abstract

In this paper we describe our experience in reproducing synchronization bugs using a model checker. We demonstrate how model checking technology can be utilized for more than just model checking. Synchronization bugs are caused by physical phenomena which cause the actual behavior of a chip to be different than predicted according to the functional model. Traditionally, verification methods such as dynamic simulation and model checking use a synchronous model, whereas the actual behavior is according to an asynchronous model. Because of this, synchronization bugs are very hard to trace. Using a model checker we were able to create a model closer to the actual behavior, and retrace many synchronization bugs. Because model checking allows us to introduce non-determinism when checking a VLSI design, and because of its ability to produce counter examples for specifications that fail, we find that model checking is the ideal tool for reproducing synchronization bugs.