An Interactive Yield Estimator as a VLSI CAD Tool

Authors:
Israel A. Wagner;Israel Koren
Affiliations:
-;-
Venue:
Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
Year:
1993

Citing 0
Cited 2

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Approximation of critical area of ICs with simple parameters extracted from the layout

DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

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Abstract