Defect Analysis and a New Fault Model for Multi-port SRAMs

• Authors:

• Pradeep Nagaraj;Shambhu Upadhaya;Kamran Zarrineh;Dean Adams

• Affiliations:

• -;-;-;-

• Venue:
• DFT '01 Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
• Year:
• 2001