Injecting Bit Flip Faults by Means of a Purely Software Approach: A Case Studied

Authors:
Raoul Velazco;A. Corominas;P. Ferreyra
Affiliations:
-;-;-
Venue:
DFT '02 Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems
Year:
2002

Citing 0
Cited 1

Reliable software for unreliable hardware: embedded code generation aiming at reliability

CODES+ISSS '11 Proceedings of the seventh IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis

Quantified Score

Hi-index	0.00

Visualization

Abstract

Bit flips provoked by radiation are a main concern for space applications. A fault injectionexperiment performed using a software simulator is described in this paper. Obtained resultsallow to predict a low sensitivity to soft errors for the studied application, putting in evidencecritical memory elements.