Thermal Testing on Reconfigurable Computers
IEEE Design & Test
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This paper is a progress report of a novel application of JBits technology. The capability of handling run-time reconfiguration is utilized to add an array of temperature sensors into a working circuit. The thermal map thus obtained provides information not only of the overall chip temperature, but also about the power consumption of each block of the design. The sensors utilized need no external components, and, by means of the partial reprogrammability of the Virtex FPGA family, no permanent occupation of any resources is made. Several experiments are summarized to illustrate the feasibility of the technique.