L. H. Goldstein;E. L. Thigpen
Sandia National Laboratories, Albuquerque, NM;Sandia National Laboratories, Albuquerque, NM
A logic design structure for LSI testability
DAC '77 Proceedings of the 14th Design Automation Conference
TMEAS, a testability measurement program
DAC '79 Proceedings of the 16th Design Automation Conference