Designing "Dual-Personality" IEEE 1149.1-Compliant Multi-Chip Modules

MCM Test Strategy Synthesis from Chip Test and Board TestApproaches

Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability

An Effective Multi-Chip BIST Scheme

Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability

Testing NASA's 3D-Stack MCM Space Flight Computer

IEEE Design & Test

Relay Propagation Scheme for Testing of MCMs on Large Area Substrates

EDTC '96 Proceedings of the 1996 European conference on Design and Test

Designing Self-Testable Multi-Chip Modules

EDTC '96 Proceedings of the 1996 European conference on Design and Test

Low Cost Test of MCMs Using Testable Die Carriers

MCMC '97 Proceedings of the 1997 Conference on IEEE Multi-Chip Module Conference

Unsafe Board States During PC-Based Boundary-Scan Testing

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Multi-TAP Controller Architecture for Digital System Chips

Journal of Electronic Testing: Theory and Applications

Distributed Diagnosis of Interconnections in SoC and MCM Designs

Journal of Electronic Testing: Theory and Applications