Testing clock distribution circuits using an analytic signal method

• Authors:

• Tamahiro J. Yamaguchi;Mani Soma;Jim Nissen;David Halter;Rajesh Raina;Masahiro Ishida

• Affiliations:

• -;-;-;-;-;-

• Venue:
• Proceedings of the IEEE International Test Conference 2001
• Year:
• 2001