Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division

  • Authors:
  • Takahiro J. Yamaguchi;Masahiro Ishida;Mani Soma;Louis Malarsie;Hirobumi Musha

  • Affiliations:
  • Advantest Laboratories Ltd., 48-2 Matubara, Kamiayashi, Aoba-ku, Sendai, Miyagi, 989-3124, Japan. jamax@atl.advantest.co.jp;Advantest Laboratories Ltd., 48-2 Matubara, Kamiayashi, Aoba-ku, Sendai, Miyagi, 989-3124, Japan. ishida@atl.advantest.co.jp;Department of Electrical Engineering, University of Washington, Seattle, WA, USA. soma@ee.washington.edu;Agere Systems, 100 Gannett Drive, South Portland, ME 04106, USA. malarsie@agere.com;Advantest Corporation, 336-1, Ohwa, Meiwa-cho, Ora-gun, Gunma, 370-0718, Japan. musha@gytmi.advantest.co.jp

  • Venue:
  • Journal of Electronic Testing: Theory and Applications
  • Year:
  • 2003

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Abstract

This paper presents a new method for measuring random timing jitter or sinusoidal timing jitter in signals of telecommunication devices. The method uses a divide-by-M circuit to reduce the frequency and the number of clock samples, and applies the Hilbert transform to measure the timing jitter. This new frequency division method is validated with experimental data from a serializer-deserializer device and a modulated signal source generating a 2.5 GHz FM signal.