Embedded Timing Analysis: A SoC Infrastructure
IEEE Design & Test
Timing Jitter Measurement of Intrinsic Random Jitter and Sinusoidal Jitter Using Frequency Division
Journal of Electronic Testing: Theory and Applications
Testing Clock Distribution Circuits Using an Analytic Signal Method
ITC '01 Proceedings of the 2001 IEEE International Test Conference
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz
IEEE Design & Test
A statistical study of the effectiveness of BIST jitter measurement techniques
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
A Low-Cost Jitter Measurement Technique for BIST Applications
Journal of Electronic Testing: Theory and Applications
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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This paper introduces the extended 驴Fmethod for measuring cycle-to-cycle period jitter in PLL outputs. The theoretical basis for this method is derived from the limited condition for the average period and analytic signal theory. Sinusoidal jitter measurements verify the relationship between cycle-to-cycle period jitter and timing jitter. To validate the method, experimental data from jitter measurements on a PowerPCTM microprocessor is analyzed in the frequency domain. Comparisons of phase quantization errors are made between the extended 驴Fmethod and the conventional zero-crossing method.