On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz

Authors:
Stephen Sunter;Aubin Roy
Affiliations:
LogicVision;LogicVision
Venue:
IEEE Design & Test
Year:
2004

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Abstract

One of the challenges of testing at multiGbps rates is jitter characterization. This article introduces a new technique that allows for attaining on-chip measurements at a substantial level of accuracy. The authors propose new algorithms that allow a wide frequency range, supporting the desired accuracy while guaranteeing signal integrity and low overhead.