How Seriously Do You Take Your Possible-Detect Faults?

  • Authors:

  • Rajesh Raina;Charles Njinda;Robert F. Molyneaux

  • Affiliations:

  • -;-;-

  • Venue:
  • Proceedings of the IEEE International Test Conference
  • Year:
  • 1997

Quantified Score

Hi-index 0.00

Visualization

Abstract