Bridging Fault Diagnosis in the Absence of Physical Information

Poirot: Applications of a Logic Fault Diagnosis Tool

IEEE Design & Test

On applying non-classical defect models to automated diagnosis

ITC '98 Proceedings of the 1998 IEEE International Test Conference

An Improved Fault Diagnosis Algorithm Based on Path Tracing with Dynamic Circuit Extraction

ITC '00 Proceedings of the 2000 IEEE International Test Conference

POIROT1: A Logic Fault Diagnosis Tool and Its Applications

ITC '00 Proceedings of the 2000 IEEE International Test Conference

Making Cause-Effect Cost Effective: Low-Resolution Fault Dictionaries

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Expediting Ramp-to-Volume Production

ITC '99 Proceedings of the 1999 IEEE International Test Conference

An Efficient Dictionary Organization for Maximum Diagnosis

Journal of Electronic Testing: Theory and Applications