Memory Built-In Self-Repair using redundant words
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown
Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Autonomic Microprocessor Execution via Self-Repairing Arrays
IEEE Transactions on Dependable and Secure Computing
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