Testing semiconductor memories: theory and practice
Testing semiconductor memories: theory and practice
Three Different MCMs, Three Different Test Strategies
Proceedings of the IEEE International Test Conference on Test and Design Validity
Memory Interconnection Test at Board Level
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
An Open Modular Test Concept for the DSP KISS-16Vs
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Using Boundary Scan Test to Test Random Access Memory Clusters
Proceedings of the IEEE International Test Conference on Designing, Testing, and Diagnostics - Join Them
Static Component Interconnect Test Technology (SCITT) A New Technology for Assembly Testing
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Hi-index | 0.00 |
A multichip package was developed to meet the marketrequirements for an advanced wireless telephone handset.The successful testing process of this multichip package,comprising test requirements, test strategy, testdevelopment and results from the production test ispresented. A wireless telephone handset, containing themultichip package is currently in high volume productionwithin Philips.