Automatic Failure-Analysis System for High-Density DRAM

Authors:
Sang-Chul Oh;Jae-Ho Kim;Ho-Jeong Choi;Si-Don Choi;Ki Tae Park;Jong-Woo Park;Wha-Joon Lee
Affiliations:
-;-;-;-;-;-;-
Venue:
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Year:
1994

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Abstract