Parametric Model Fitting: From Inlier Characterization to Outlier Detection
IEEE Transactions on Pattern Analysis and Machine Intelligence
Recognizing Objects by Their Appearance Using Eigenimages
SOFSEM '00 Proceedings of the 27th Conference on Current Trends in Theory and Practice of Informatics
Two-View Multibody Structure-and-Motion with Outliers through Model Selection
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Model-Selection Framework for Multibody Structure-and-Motion of Image Sequences
International Journal of Computer Vision
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