New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements

  • Authors:
  • David E. Root;John Wood;Nick Tufillaro

  • Affiliations:
  • Agilent Technologies, Santa Rosa, CA;Agilent Technologies, Santa Rosa, CA;Agilent Laboratories, Palo Alt, CA

  • Venue:
  • Proceedings of the 40th annual Design Automation Conference
  • Year:
  • 2003

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Abstract

This paper compares and contrasts recent nonlinear behavioral modeling techniques designed for microwave and RFIC applications which arise in radio and communication systems, and in the design of broad-band nonlinear components used for microwave instrumentation. These techniques include dynamic neural networks and nonlinear time series models in the time-domain, nonlinear describing functions in the frequency domain, and envelope-based methods in mixed time and frequency domains. Approaches to generating these models from both simulation and nonlinear microwave measurements are reviewed.