Fast penetration depth estimation using rasterization hardware and hierarchical refinement

  • Authors:
  • Young J. Kim;Miguel A. Otaduy;Ming C. Lin;Dinesh Manocha

  • Affiliations:
  • UNC-Chapel Hill;UNC-Chapel Hill;UNC-Chapel Hill;UNC-Chapel Hill

  • Venue:
  • Proceedings of the nineteenth annual symposium on Computational geometry
  • Year:
  • 2003

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Abstract