Combinational Test Generation for Various Classes of Acyclic Sequential Circuits
ITC '01 Proceedings of the 2001 IEEE International Test Conference
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We show that the test generation problem for all single stuck-at-faults in sequential circuits with internally balanced structures is reduced into the test generation problem for single stuck-at-faults in combinational circuits. In our previous work, we introduced internally balanced structures as a class of sequential circuits with the combinational test generation complexity. However, single stuck-at-faults on some primary inputs, called separable primary inputs, corresponded to multiple stuck-at faults in a transformed combinational circuit. In this paper we resolve this problem. We show how to generate a test sequence and identify undetectability for single stuck-at-faults on separable primary inputs.