| Hi-index | 0.01 |
A previously proposed test generation procedure based on genetic optimization proved to have several advantages in terms of fault coverage; however, it produced large test set sizes. We investigate a way to generate compact test sets using this procedure by embedding it into a test compaction procedure. The compaction procedure constructs a compact test set out of the best tests contained in several test sets produced by the genetic optimization based test generation procedure. Using this approach, it is possible to significantly reduce the test set sizes obtained.